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Instructors:
The instructors are Edward F. Kelley and Paul A. Boynton who
have been involved in display measurements since the early 1990s. Both
have given seminars to international audiences and Ed Kelley has given
short courses. In addition, both are active contributors to several
international standards organizations that work on creating measurement
methods for displays. Paul serves as the chair of the Standards and
Definitions Committee of the Society of Information Display (SID), and
Ed serves as the editor of the VESA (Video Electronics Standards
Association) FPDM (Flat Panel Display Measurements Standard) as well as
its main author. Ed also serves as the Associate Editor for Display
Metrology for the Journal of the SID.
Items
you will receive:
- White reflectance standard that you characterize in our laboratories
- Black glass sample that you characterize in our laboratories
- Reflection samples similar
to displays that you characterize in our laboratories. Thus, you will
take back with you not only the white standard and black glass, but
also reflection samples that you've characterized in a variety of ways.
- Mini-flashlight
for quick inspection of reflection properties
- The 322 page VESA Flat Panel Display Measurements Standard (FPDM)
- USB memory stick for recording and keeping your data (spreadsheets). It will contain the detailed experiment examples (completed spreadsheets) and the lecture presentation (animated slides)
- Hard copy of lecture presentation
THREE-DAY COURSE:
Lecture
Topics: Mornings of Days 1 and 2 (Tuesday and Wednesday)
- Review of radiometry, photometry, and colorimetry
- Discussion of quantities and units used in photometry
- Review of simple photometric calculations
- Review of types of measurement instrumentation
- Veiling glare and management of stray light
- Use of flat masks and frusta
- Display reflection characterization
- Reflection haze and robustness
- Bidirectional reflectance distribution function
- Projection measurements
- Diagnostics
- Measurement uncertainty
- Laboratory redundancy
- Review of reflection measurements in some standards, e.g.,
- SAE J1757 (ISO 15008)
- ISO 13406 & 9241
- Reflection robustness (common configurations)
- e.g. SAE J1757 (ISO 15008), ISO 13406, ISO 9241, others
- Projection measurements
- Dealing with room reflections
- Use of stray-light elimination tubes (SLETs)
- Small area measurements
- Reflection measurements
- Specular and Diffuse (diffuse has Lambertian and haze components)
- Scaling to daylight levels
- Sensitivity to apparatus geometry
- Sensitivity to source spectra
- Characterization of white reflectance standard
- Characterization of black glass
- BRDF measurements (low and high resolution)
- Diffuse reflection measurements
- Colors and gamut measurements with detector diagnostics
- Comparison of various color measurement instrument
technologies
- Use of masks and frusta
- Small-area contrast measurements
- Properties of array cameras (e.g. CCD cameras)
- Considerations for uniform sources
Note that both the lecture material and laboratory work is
subject to
change as needed.